Aberration-Corrected Analytical Electron Microscopy 1st Edition by Rik Brydson – Ebook PDF Instant Download/Delivery: 0470518510, 9780470518519
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Product details:
ISBN 10: 0470518510
ISBN 13: 9780470518519
Author: Rik Brydson
Aberration-Corrected Analytical Electron Microscopy 1st Edition: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Aberration-Corrected Analytical Electron Microscopy 1st Edition Table of contents:
- Chapter 1: General introduction to transmission electron microscopy (TEM)
- Chapter 2: Introduction to electron optics
- Chapter 3: Development of STEM
- Chapter 4: Lens aberrations: diagnosis and correction
- Chapter 5: Theory and simulations of STEM imaging
- Chapter 6: Details of STEM
- Chapter 7: Electron energy loss spectrometry and energy dispersive X-ray analysis
- Chapter 8: Applications of aberration-corrected scanning transmission electron microscopy
- Chapter 9: Aberration-corrected imaging in CTEM
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Rik Brydson,Aberration,Corrected,Analytical,Electron,Microscopy



