Optical Shop Testing 3rd Edition by Daniel Malacara ISBN 0471484040 9780471484042

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ISBN 10: 0471484040

ISBN 13: 9780471484042 

Author: Daniel Malacara

The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.

Table of contents:

Chapter 1 Newton, Fizeau, and Haidinger Interferometers

• Introduction

• Newton Interferometer

• Fizeau Interferometer

• Haidinger Interferometer

• Absolute Testing of Flats

Chapter 2 Twyman–Green Interferometer

• Introduction

• Beam-Splitter

• Coherence Requirements

• Uses of a Twyman–Green Interferometer

• Compensation of Intrinsic Aberrations

• Unequal-Path Interferometer

• Open Path Interferometers

• Variations from the Twyman–Green Configuration

• Twyman–Green Interferograms and Analysis

Chapter 3 Common-Path Interferometers

• Introduction

• Burch’s Interferometer

• Birefringent Beam Splitters

• Lateral Shearing Interferometers

• Double-Focus Interferometer

• Saunders’s Prism Interferometer

• Point Diffraction Interferometer

• Zernike Tests

Chapter 4 Lateral Shear Interferometers

• Introduction

• Coherence Properties of Light

• Theory and Evaluation

• Lateral Shearing Interferometers in Collimated and Convergent Light

• Lateral Shearing Interferometers Using Lasers

• Other Types of Lateral Shearing Interferometers

• Vectorial Shearing Interferometer

Chapter 5 Radial, Rotational, and Reversal Shear Interferometer

• Introduction

• Radial Shear Interferometers

• Rotational Shear Interferometers

• Reversal Shear Interferometers

Chapter 6 Multiple-Beam Interferometers

• Introduction

• Precision in Multiple-Beam Interferometry

• Multiple-Beam Fizeau Interferometer

• Fringes of Equal Chromatic Order

• Fabry–Perot Interferometer

• Tolansky Fringes

• Coupled and Series Interferometers

• Holographic Multiple-Beam Interferometers

• Temporal Evolution of FP Fringes

Chapter 7 Multiple-Pass Interferometers

• Double-Pass Interferometers

• Multipass Interferometry

Chapter 8 Foucault, Wire, and Phase Modulation Tests

• Introduction

• Foucault or Knife-Edge Test

• Wire Test

• Platzeck–Gaviola Test

• Phase Modulation Tests

• Ritchey–Common Test

Chapter 9 Ronchi Test

• Introduction

• Geometrical Theory

• Wavefront Shape Determination

• Physical Theory

• Practical Aspects and Related Tests

Chapter 10 Hartmann, Hartmann–Shack, and Other Screen Tests

• Introduction

• Hartmann Test Using Various Screens

• Wavefront Retrieval

• Hartmann–Shack Test

• Crossed Cylinder Test

• Testing with Array of Light Sources

• Michelson–Gardner–Bennett Tests

• Other Developments

Chapter 11 Star Tests

• Introduction

• Star Test with Small Aberrations

• Practical Aspects with Small Aberrations

• Star Test with Large Aberrations

• Wavefront Retrieval

Chapter 12 Testing of Aspheric Wavefronts and Surfaces

• Introduction

• Methods to Test Aspheric Wavefronts

• Null Testing Configurations

• Testing Convex Hyperboloidal and Cylindrical Surfaces

• Compensators (Refractive and Reflecting)

• Interferometers Using Real and Synthetic Holograms

• Two-Wavelength Holography

• Wavefront Stitching

Chapter 13 Zernike Polynomial and Wavefront Fitting

• Introduction

• Aberrations of Rotationally Symmetric Systems

• Zernike Circle Polynomials

• Zernike Annular Polynomials

• Determination of Zernike Coefficients

• Summary

Chapter 14 Phase Shifting Interferometry

• Introduction

• Fundamental Concepts and Advantages

• Methods of Phase Shifting

• Detecting the Wavefront Phase

• Data Collection

• PSI Algorithms

• Phase Shift Calibration

• Error Sources

• Detectors and Spatial Sampling

• Quality Functions

• Phase Unwrapping

• Aspheres and Extended Range PSI Techniques

• Other Analysis Methods

• Computer Processing and Output

• Implementation and Applications

• Future Trends

Chapter 15 Surface Profilers, Multiple Wavelength, and White Light Interferometry

• Introduction to Surface Profilers

• Contact Profilometers

• Optical Profilers

• Interferometric Optical Profilers

• Two- and Multiple-Wavelength Techniques

• White Light Interference Optical Profilers

• Wavelength Scanning Interferometer

• Spectrally Resolved White Light Interferometry

• Polarization Interferometers

• Optical Ranging Methods

• Summary

Chapter 16 Optical Metrology of Diffuse Surfaces

• Moiré and Fringe Projection Techniques

• Holographic and Speckle Tests

Chapter 17 Angle, Prisms, Curvature, and Focal Length Measurements

• Divided Circles and Goniometers

• Autocollimator

• Testing of Prisms

• Radius of Curvature Measurements

• Focal Length Measurements

Chapter 18 Mathematical Representation of an Optical Surface and Its Characteristics

• Definition of an Optical Surface

• Parameters and Expansions for Conic Surfaces

• Primary Aberrations of Spherical Surfaces

• Astigmatic Surfaces

• Off-Axis Conicoids

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