Optics of Charged Particle Analyzers 1st Edition by Mikhail Yavor ISBN 0123747686 978-0123747686

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Product details:

ISBN 10: 0123747686 

ISBN 13: 978-0123747686

Author: Mikhail Yavor 

Advances in Imaging and Electron Physics merges two long-running serials–Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading international scholars and industry experts
• Discusses hot topic areas and presents current and future research trends
• Invaluable reference and guide for physicists, engineers and mathematicians

Table of contents:

Chapter 1: Charged Particles in Electromagnetic Fields
Chapter 2: Aberration Expansions in Charged Particle Optics
Chapter 3: Transporting Charged Particle Beams in Static Fields
Chapter 4: Expulsion of Charged Particles by Radiofrequency Fields
Chapter 5: Transporting and Separating Ions in Gas-Filled Channels

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Tags: Mikhail Yavor, Optics of Charged, Particle Analyzers