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Reliability Wearout Mechanisms in Advanced CMOS Technologies IEEE Press Series on Microelectronic Systems 1st Edition Alvin W. Strong

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Reliability Wearout Mechanisms in Advanced CMOS Technologies IEEE Press Series on Microelectronic Systems 1st Edition Alvin W. Strong Digital Instant Download

Author(s): Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III
ISBN(s): 0471731722
Edition: 1
File Details: PDF, 5.38 MB
Year: 2009
Language: english
SKU: EB-2142400 Category: Tags: , , , , , ,

Reliability Wearout Mechanisms in Advanced CMOS Technologies IEEE Press Series on Microelectronic Systems 1st Edition Alvin W. Strong – Ebook Instant Download/Delivery ISBN(s): 0471731722