Structure Analysis of Advanced Nanomaterials 1st Edition by Takeo Oku ISBN 3110304724 978-3110304725

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Product details:

ISBN 10: 3110304724

ISBN 13: 978-3110304725 

Author:  Takeo Oku 

High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes.

Table of contents:

Preface
Contents
Table for physical constants
1 Introduction
1.1 Characteristic of electron microscopy
1.2 What information can be obtained by electron microscopy?
1.3 Various types of electron microscopy
2 Structure and principle of electron microscopes
2.1 Structure of transmission electron microscope
2.2 Observation mechanism of atoms by electrons
2.3 Information from electron diffraction pattern
2.4 High-resolution electron microscopy
2.5 Scanning electron microscope
2.6 Electron energy-loss spectroscopy
2.7 Energy dispersive X-ray spectroscopy
2.8 High-angle annular dark-field scanning TEM
2.9 Electron holography and Lorentz microscopy
2.10 Image simulation
3 Practice of HREM
3.1 Sample preparation
3.2 Specimen preparation methods
3.3 Structure analysis by X-ray diffraction
3.4 TEM observation
3.5 HREM observation
3.6 Fourier filtering
3.7 Resolution of HREM images
3.8 Prevention of damage and contamination
3.9 Taking images and reading data
3.10 Mental attitude for TEM
4 Characterization by HREM
4.1 What information can be obtained?
4.2 Direct atomic observation
4.3 Crystallographic image processing
4.4 Comparison of HREM image with calculated images
4.5 Atomic coordinates from HREM image

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Tags: Takeo Oku, Structure Analysis, Advanced Nanomaterials